Electronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions

Abstract

AbstractElectronic gaps play an important role in the electric and optical properties of materials. Although various experimental techniques, such as scanning tunnelling spectroscopy and optical or photoemission spectroscopy, are normally used to perform electronic band structure characterizations, it is still challenging to measure the electronic gap at the nanoscale under ambient conditions. Here we report a scanning probe microscopic technique to characterize the electronic gap with nanometre resolution at room temperature and ambient pressure. The technique probes the electronic gap by monitoring the changes of the local quantum capacitance via the Coulomb force at a mesoscopic scale. We showcase this technique by characterizing several 2D semiconductors and van der Waals heterostructures under ambient conditions.