Scanning probe microscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Medicine
Link
http://www.nature.com/articles/s43586-021-00033-2.pdf
Reference329 articles.
1. Binnig, G., Rohrer, H., Gerber, C. & Weibel, E. Surface studies by scanning tunneling microscopy. Phys. Rev. Lett. 49, 57–61 (1982). This work reports the first atomically resolved image of conductive surfaces with STM.
2. Binnig, G., Quate, C. F. & Gerber, C. Atomic force microscope. Phys. Rev. Lett. 56, 930–933 (1986). This work develops AFM for probing non-conductive surfaces.
3. Quate, C. F. Vacuum tunneling — a new technique for microscopy. Phys. Today 39, 26–33 (1986).
4. Lortscher, E., Widmer, D. & Gotsmann, B. Next-generation nanotechnology laboratories with simultaneous reduction of all relevant disturbances. Nanoscale 5, 10542–10549 (2013).
5. Besocke, K. An easily operable scanning tunneling microscope. Surf. Sci. 181, 145–153 (1987).
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