Real time in situ x-ray diffraction study of the crystalline structure modification of Ba0.5Sr0.5TiO3 during the post-annealing
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Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-018-30392-y.pdf
Reference21 articles.
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2. Kim, W. J. et al. Microwave dielectric properties of strained (Ba0.4Sr0.6TiO3) thin films. J. Appl. Phys. 88, 5448–5451 (2000).
3. Chang, W., Alldredge, L. M. B., Kirchoefer, S. W. & Pond, J. M. Microwave dielectric properties of strained Ba0.5Sr0.5TiO3 films with and without strain-induced permanent polarization at room temperature. J. Appl. Phys. 102, 014105 (2007).
4. Ban, Z. G. & Alpay, S. P. Optimization of the tunability of barium strontium titanate films via epitaxial stresses. J. Appl. Phys. 93, 504–511 (2003).
5. Zhu, X. H. et al. Influence of oxygen pressure on the structural and dielectric properties of laser-ablated Ba0.5 Sr0.5TiO3 thin films epitaxially grown on (001) MgO for microwave phase shifters. J. Phys. D: Appl. Phys. 39, 2282–2288 (2006).
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