Full-wave modeling of broadband near field scanning microwave microscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-017-13937-5.pdf
Reference48 articles.
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3. Tselev, A. et al. Near-field microwave scanning probe imaging of conductivity inhomogeneities in cvd graphene. Nanotechnology 23, 385706 (2012).
4. Plassard, C. et al. Detection of defects buried in metallic samples by scanning microwave microscopy. Physical Review B 83, 121409 (2011).
5. Lai, K., Ji, M., Leindecker, N., Kelly, M. & Shen, Z. Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes. Review of scientific instruments 78, 063702 (2007).
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