Enhanced method for High Spatial Resolution surface imaging and analysis of fungal spores using Scanning Electron Microscopy
Author:
Funder
University Grants Commission
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/s41598-018-34629-8.pdf
Reference35 articles.
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2. Kaminskyj, S. G. W. & Dahms, T. E. S. High spatial resolution surface imaging and analysis of fungal cells using SEM and AFM. Micron 39, 349–61 (2008).
3. Smith, K. C. A. & Oatley, C. W. The scanning electron microscope and its fields of application. Br. J. Appl. Phys. 6, 391–399 (1955).
4. Vernon-Parry, K. D. Scanning electron microscopy: an introduction. III-Vs Rev. 13, 40–44 (2000).
5. Pathan, A. K., Bond, J. & Gaskin, R. E. Sample preparation for SEM of plant surfaces. Mater. Today 12, 32–43 (2009).
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