Multiscale 3D X-ray imaging

Author:

Kline R. JosephORCID

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Advancements in metrology for advanced semiconductor packaging;Optics and Photonics for Advanced Dimensional Metrology III;2024-06-18

2. Single-shot, coherent, pop-out 3D metrology;Communications Physics;2023-11-04

3. Density-discriminating chromatic x-ray imaging based on metal halide nanocrystal scintillators;Science Advances;2023-09-15

4. Metrology;2021 IEEE International Roadmap for Devices and Systems Outbriefs;2021-11

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