Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

Published:2015-06-12 Issue:1 Volume:5 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Shibata Naoya,Findlay Scott D.,Sasaki Hirokazu,Matsumoto Takao,Sawada Hidetaka,Kohno Yuji,Otomo Shinya,Minato Ryuichiro,Ikuhara Yuichi

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/srep10040.pdf

Reference19 articles.

1. Dekkers, N. H. & de Lang, H. Differential phase contrast in a STEM. Optik, 41, 452–456 (1974).

2. Hamilton, D. K. & Sheppard, C. J. R. Differential phase contrast in scanning optical microscopy. J. Microscopy, 133, 27–39 (1984).

3. Pfeiffer, F., Weitkamp, T., Bunk, O. & David, C. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources. Nature Phys., 2, 258–261 (2006).

4. Amos, W. B., Reichelt, S., Cattermole, D. M. & Laufer J. Re-evaluation of differential phase contrast (DPC) in a scanning laser microscope using a spit detector as an alternative to differential interference contrast (DIC) optics. J. Microscopy, 210, 166–175 (2003).

5. Hornberger, B. et al. Differential phase contrast with a segmented detector in a scanning X-ray microscope. J. Synch. Rad., 15, 355–362 (2008).

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