Imaging of Magnetic Field Gradient around a Current Path by Alternating Magnetic Force Microscopy
Author:
Affiliation:
1. Chiba Institute of Technology
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Link
https://www.jstage.jst.go.jp/article/ieejsmas/144/4/144_62/_pdf
Reference40 articles.
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5. (5) L. Zhu and T. P. Chow: “Analytical Modeling of High-Voltage 4H-SiC Junction Barrier Schottky (JBS) Rectifiers”, IEEE Trans. Electron Devices, Vol. 55, pp. 1857-1625 (2008)
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