Determination of the band parameters of bulk 2H-MX2 (M = Mo, W; X = S, Se) by angle-resolved photoemission spectroscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep36389.pdf
Reference43 articles.
1. Novoselov, K. S. et al. Electric field effect in atomically thin carbon films. Science 306, 666–669 (2004).
2. Novoselov, K. S. et al. Two-dimensional gas of massless Dirac fermions in graphene. Nature (London) 438, 197–200 (2005).
3. Zhang, Y. B., Tan, Y. W., Stormer, H. L. & Kim, P. Experimental observation of the quantum Hall effect and Berry’s phase in graphene. Nature 438, 201–204 (2005).
4. Novoselov, K. S. et al. Two-dimensional atomic crystals. Proc. Natl. Acad. Sci. 102, 10451–10453 (2005).
5. Ganatra, R. & Zhang, Q. Few-layer MoS2: a promising layered semiconductor. ACS Nano 8, 4074–4099 (2014).
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