In situ X-ray nanotomography of metal surfaces during electropolishing
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep15257.pdf
Reference45 articles.
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4. Sun, W. X. et al. Preparation of cantilevered W tips for atomic force microscopy and apertureless near-field scanning optical microscopy. Review of Scientific Instruments 73, 2942–2947 (2002).
5. Tahmasebipour, G., Hojjat, Y., Ahmadi, V. & Abdullah, A. Optimization of STM/FIM nanotip aspect ratio based on the Taguchi method. International Journal of Advanced Manufacturing Technology 44, 80–90 (2009).
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