RETRACTED ARTICLE: Enhancement of the blue photoluminescence intensity for the porous silicon with HfO2 filling into microcavities
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Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://www.nature.com/articles/srep15574.pdf
Reference38 articles.
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5. Lin, C. C. & Kuo, Y. Light emission from conductive paths in nanocrystalline CdSe embedded Zr-doped HfO2 high-k stack. Appl. Phys. Lett. 106, 121107 (2015).
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1. FORMATION AND PHOTOLUMINESCENCE PROPERTIES OF POROUS SILICON/COPPER OXIDE NANOCOMPOSITES FABRICATED VIA ELECTROCHEMICAL DEPOSITION TECHNIQUE FOR PHOTODETECTOR APPLICATION;Digest Journal of Nanomaterials and Biostructures;2021-01
2. Retraction Note: Enhancement of the blue photoluminescence intensity for the porous silicon with HfO2 filling into microcavities;Scientific Reports;2020-04-23
3. Effects of Electrochemical Etching Conditions on the Formation and Photoluminescence Properties of P-Type Porous Silicon;IOP Conference Series: Materials Science and Engineering;2019-03-19
4. Grain fragmentation and phase transformations in hafnium oxide induced by swift heavy ion irradiation;Applied Physics A;2018-08-06
5. Improvement of Charge Injection Using Ferroelectric Si:HfO2 As Blocking Layer in MONOS Charge Trapping Memory;IEEE Journal of the Electron Devices Society;2018
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