Composition mapping at high resolution-Reference-Cited by-同舟云学术

Composition mapping at high resolution

Published:1998-04 Issue:1‐2 Volume:190 Page:171-183
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Schwander P.¹,Rau W‐D.¹,Ourmazd A.¹

Affiliation:

1. Institute for Semiconductor Physics, Walter‐Korsing‐Str. 2, 15230 Frankfurt (Oder), Germany and Technical University of Brandenburg–Cottbus, PO Box 101 344, 03013 Cottbus, Germany

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1046/j.1365-2818.1998.3400882.x

Reference48 articles.

1. Quantitative chemical mapping: Spatial resolution

2. Direct measurement of local lattice distortions in strained layer structures by HREM

3. Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy

4. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy

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