True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy
Author:
Affiliation:
1. Department of Mechanical Engineering, University of California Merced, Merced, California95343United States
Funder
U.S. Department of Defense
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c08321
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5. Atomic Force Microscope
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