Standardization of Chemically Selective Atomic Force Microscopy for Metal Oxide Surfaces-Reference-Cited by-同舟云学术

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Standardization of Chemically Selective Atomic Force Microscopy for Metal Oxide Surfaces

Published:2024-08-05 Issue: Volume: Page:
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Wiesener Philipp¹²,Förster Stefan³,Merkel Milena¹²,Schulze Lammers Bertram¹²,Fuchs Harald¹⁴,Amirjalayer Saeed¹²^ORCID,Mönig Harry¹²^ORCID

Affiliation:

1. Universität Münster, Physikalisches Institut, Münster 48149, Germany

2. Center for Nanotechnology, Münster 48149, Germany

3. Martin-Luther-Universität Halle-Wittenberg Institut für Physik, Halle 06120, Germany

4. Center for Multiscale Theory and Computation, Münster 48149, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.4c03155

Reference63 articles.

1. Designing interfaces in energy materials applications with first-principles calculations

2. Fundamentals of chemical functionalities at oxide interfaces

3. Towards Oxide Electronics: a Roadmap

4. Low-Temperature-Grown Transition Metal Oxide Based Storage Materials and Oxide Transistors for High-Density Non-volatile Memory

5. Surface Reconstructions of Metal Oxides and the Consequences on Catalytic Chemistry

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stoichiometric reconstruction of the Al ₂ O ₃ (0001) surface;Science;2024-09-13

2. Standardization of Chemically Selective Atomic Force Microscopy for Metal Oxide Surfaces;ACS Nano;2024-08-05

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