Quantitative Electromechanical Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Quantitative Electromechanical Atomic Force Microscopy

Published:2019-07-03 Issue:7 Volume:13 Page:8055-8066
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Collins Liam¹^ORCID,Liu Yongtao¹²,Ovchinnikova Olga S.¹^ORCID,Proksch Roger³^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

2. Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States

3. Asylum Research, An Oxford Instruments Company, Santa Barbara, California 93117, United States

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.9b02883

Reference92 articles.

1. Atomic Force Microscope

2. Local poling of ferroelectric polymers by scanning force microscopy

3. Mechanisms of electromechanical coupling in strain based scanning probe microscopy

4. Nanoscale Characterisation of Ferroelectric Materials

5. Nanoscale Phenomena in Ferroelectric Thin Films

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