Polarized Tunneling Transistor for Ultrafast Memory

Author:

Chen Jing12ORCID,Dun Guanhua1ORCID,Hu Jianguo1ORCID,Lin Zhu1,Wang Yuhao1,Lu Tian1,Li Ping1,Wei Tiantian1,Zhu Junqiang3,Wang Jing3,Li Xiyou1,Wu Xiao-Ming1,Yang Yi1,Ren Tian-Ling1ORCID

Affiliation:

1. School of Integrated Circuits & Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China

2. Institute of Marine Science and Technology, Shandong University, Qingdao, Shandong 266237, China

3. State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University, Shanghai 200433, China

Funder

National Key Research and Development Program of China

Guoqiang Institute, Tsinghua University

Tsinghua University

National Natural Science Foundation of China

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Reference53 articles.

1. International Roadmap for Devices and Systems (IRDS); https://irds.ieee.org/ (24-July-2017).

2. Prospective of Semiconductor Memory Devices: from Memory System to Materials

3. International Technology Roadmap for Semiconductors 2.0 (ITRS); http://www.itrs2.net/ (24-May-2016).

4. A 128Gb 1-bit/Cell 96-Word-Line-Layer 3D Flash Memory to Improve the Random Read Latency With tProg = 75 μs and tR = 4 μs

5. Electric Field Effect in Atomically Thin Carbon Films

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