Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island-Reference-Cited by-同舟云学术

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Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island

Published:2021-05-28 Issue:6 Volume:15 Page:10377-10383
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Schumacher Zeno¹^ORCID,Rejali Rasa¹,Cowie Megan¹,Spielhofer Andreas¹,Miyahara Yoichi¹^ORCID,Grutter Peter¹^ORCID

Affiliation:

1. Department of Physics, McGill University, Montreal, Quebec H3A 2T8, Canada

Funder

Schweizerischer Nationalfonds zur F??rderung der Wissenschaftlichen Forschung

Fonds de Recherche du Qu??bec - Nature et Technologies

Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.1c02600

Reference34 articles.

1. Minority carrier lifetime in polycrystalline silicon solar cells studied by photoassisted Kelvin probe force microscopy

2. Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy

3. FM demodulated Kelvin probe force microscopy for surface photovoltage tracking

4. Intensity-Modulated Scanning Kelvin Probe Microscopy for Probing Recombination in Organic Photovoltaics

5. Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Bulk Heterojunction Organic Solar Cells

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1. Investigation of atomic surface potential on Si(111)-7×7 surface by high-frequency heterodyne-Kelvin probe force microscopy;Surfaces and Interfaces;2024-06

2. Investigation of semiconductor properties of Co/Si(111)-7 × 7 by AFM/KPFS;Journal of Physics: Condensed Matter;2023-03-09

3. High–low Kelvin probe force spectroscopy for measuring the interface state density;Beilstein Journal of Nanotechnology;2023-01-31

4. Recent advances in doped organic field-effect transistors: mechanism, influencing factors, materials, and development directions;Journal of Materials Chemistry C;2023

5. Investigation of Atomic Surface Potential on Si(111)-7×7 Surface by High-Frequency Heterodyne-Kelvin Probe Force Microscopy;2023

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