FM demodulated Kelvin probe force microscopy for surface photovoltage tracking-Reference-Cited by-同舟云学术

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FM demodulated Kelvin probe force microscopy for surface photovoltage tracking

Published:2005-01-12 Issue:3 Volume:16 Page:S1-S6
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Loppacher Christian,Zerweck Ulrich,Teich Sebastian,Beyreuther Elke,Otto Tobias,Grafström Stefan,Eng Lukas M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/16/i=3/a=001/pdf

Reference20 articles.

1. Surface photovoltage phenomena: theory, experiment, and applications

2. Photoassisted scanning tunneling microscopy

3. Semiconductor characterization by scanning force microscope surface photovoltage microscopy

4. Scanning tunneling microscopy of photoexcited carriers at the Si(001) surface

5. Electrostatic sample-tip interactions in the scanning tunneling microscope

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1. Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes;Ultramicroscopy;2022-11

2. Using stochastic search algorithms and neural networks for the determination of the actual distribution of the electric potential measured by auto-compensated electrostatic induction probes;Journal of Electrostatics;2022-07

3. Probe Characterization Using Stochastic Search Algorithms and Radial Basis Functions Neural Networks;2022 19th International Multi-Conference on Systems, Signals & Devices (SSD);2022-05-06

4. Hidden surface photovoltages revealed by pump probe KPFM;Nanotechnology;2022-03-08

5. Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode;Beilstein Journal of Nanotechnology;2021-10-06

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