Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation
Author:
Affiliation:
1. Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands
Funder
Provincie Overijssel
ASML
Nederlandse Organisatie voor Wetenschappelijk Onderzoek
Carl Zeiss AG
Malvern Panalytical Ltd
MESA+ Institute for Nanotechnology, University of Twente
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
http://pubs.acs.org/doi/pdf/10.1021/acsami.9b14414
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5. Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach
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