Current Rerouting Improves Heat Removal in Few-Layer WSe2 Devices-Reference-Cited by-同舟云学术

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Current Rerouting Improves Heat Removal in Few-Layer WSe2 Devices

Published:2020-03-03 Issue:12 Volume:12 Page:14323-14330
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Majee Arnab K.¹,Hemmat Zahra²^ORCID,Foss Cameron J.¹,Salehi-Khojin Amin²,Aksamija Zlatan¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003-9292, United States

2. Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, Illinois 60607, United States

Funder

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.9b22039

Reference41 articles.

1. A roadmap for graphene

2. Surface Defects-Induced p-type Conduction of Silicon Nanowires

3. Mapping of Defects in Individual Silicon Nanocrystals Using Real-Space Spectroscopy

4. Two-Dimensional MX2 Semiconductors for Sub-5 nm Junctionless Field Effect Transistors

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4. Atomistic measurement and modeling of intrinsic fracture toughness of two-dimensional materials;Proceedings of the National Academy of Sciences;2022-11-04

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