Study of in Situ Silver Migration in Amorphous Boron Nitride CBRAM Device
Author:
Affiliation:
1. Division of Materials Science and Engineering, Hanyang University, Seoul 04763, Republic of Korea
2. Department of Physics, Khalifa University, Abu Dhabi 127788, United Arab Emirates
Funder
National Research Foundation of Korea
Ministry of Trade, Industry and Energy
Korea Semiconductor Research Consortium
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/acsami.9b05384
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