Tungsten Nitrido Complexes as Precursors for Low Temperature Chemical Vapor Deposition of WNxCy Films as Diffusion Barriers for Cu Metallization
Author:
Affiliation:
1. Department of Chemistry, University of Florida, Gainesville, Florida, 32611-7200, United States
2. Department of Chemical Engineering, University of Florida, Gainesville, Florida, 32611-6005, United States
Funder
National Science Foundation
Publisher
American Chemical Society (ACS)
Subject
Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis
Link
https://pubs.acs.org/doi/pdf/10.1021/ja4117582
Reference93 articles.
1. ITRS International Technology Roadmap for Semiconductors: 2011ed.International SEMATECH, 2011.
2. The evolution of diffusion barriers in copper metallization
3. Ultrathin Diffusion Barriers/Liners for Gigascale Copper Metallization
4. Magnetron sputter deposition with high levels of metal ionization
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