Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene-Reference-Cited by-同舟云学术

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Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene

Published:2007-06-21 Issue:27 Volume:111 Page:7711-7714
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Jaquith Michael¹,Muller Erik M.¹,Marohn John A.¹

Affiliation:

1. Cornell University, Ithaca, New York 14853-1301

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp073626l

Reference25 articles.

1. Organic Thin Film Transistors for Large Area Electronics

2. Extracting Parameters from the Current-Voltage Characteristics of Organic Field-Effect Transistors

3. Effects of Grain Boundaries, Field-Dependent Mobility, and Interface Trap States on the Electrical Characteristics of Pentacene TFT

4. Influence of trapped and interfacial charges in organic multilayer light-emitting devices

5. Evidence of mobile charged impurities in organic heterojunction photovoltaic devices

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2. Influences of atomic force microscopy probe on the electrical properties of rubrene crystal device;Chinese Journal of Analytical Chemistry;2023-04

3. Tailoring Trap Density of States through Impedance Analysis for Flexible Organic Field‐Effect Transistors;Advanced Materials Interfaces;2021-07-12

4. Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy;physica status solidi (a);2020-09-22

5. 2D Charge Density Probing at Aluminum / SiNx Interface: a Sub-micrometric Investigation by Kelvin Probe Force Microscopy;2020 IEEE 3rd International Conference on Dielectrics (ICD);2020-07-05

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