Influences of atomic force microscopy probe on the electrical properties of rubrene crystal device

Author:

ZHANG Xu-Zhao,GAO Shu-Jing,QU Ying-Jie,WANG Hai-TingORCID

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Analytical Chemistry

Reference25 articles.

1. Strained α-Sn thin films on highly lattice-mismatched Ge substrates;Stabile;Mater Today Adv,2021

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4. Direct mapping of the gate response of a multilayer WSe2/MoS2 heterostructure with locally different degrees of charge depletion;Kim;J Phys Chem Lett,2019

5. Influences of water molecules on the electronic properties of atomically thin molybdenum disulfide;Zhang;Appl Phys Lett,2017

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