Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy-Reference-Cited by-同舟云学术

Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy

Published:2020-09-22 Issue:20 Volume:217 Page:2000190
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Wang Jin¹,Zhang He¹,Cao Guo-sheng²,Xie Ling-hai¹,Huang Wei¹³^ORCID

Affiliation:

1. Key Laboratory for Organic Electronics and Information Displays Institute of Advanced Materials (IAM) Nanjing University of Posts and Telecommunications 9 Wenyuan Road Nanjing 210023 China

2. School of Physics and Electronic Science Shanxi Datong University Xingyun Street Datong 037009 China

3. Frontiers Science Center for Flexible Electronics (FSCFE) Shaanxi Institute of Flexible Electronics (SIFE) Shaanxi Institute of Biomedical Materials and Engineering (SIBME) Northwestern Polytechnical University (NPU) 127 West Youyi Road Xi'an 710072 China

Funder

National Natural Science Foundation of China

Nanjing University of Posts and Telecommunications

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.202000190

Reference134 articles.

1. Space-charge electrets

2. Charge distribution and transport in polymers

3. Electrets: recent developments

4. Measuring and modeling transient insulator response to charging: the contribution of surface potential studies

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