Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study-Reference-Cited by-同舟云学术

Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study

Published:2009-12-18 Issue:2 Volume:114 Page:769-774
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Sjövall P.¹,Rading D.¹,Ray S.¹,Yang L.¹,Shard A. G.¹

Affiliation:

1. Chemistry and Materials Technology, SP Technical Research Institute of Sweden, PO Box 857, SE-50115 Borås, Sweden, ION-TOF GmbH, Heisenbergstrasse 15, 48149 Münster, Germany, and National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, U.K.

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp9095216

Reference26 articles.

1. The Magic of Cluster SIMS

2. Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials

3. Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

4. Sputtering of organic molecules by clusters, with focus on fullerenes

5. Molecular Depth Profiling with Cluster Ion Beams

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