Direct Atom-by-Atom Chemical Identification of Nanostructures and Defects of Topological Insulators-Reference-Cited by-同舟云学术

Direct Atom-by-Atom Chemical Identification of Nanostructures and Defects of Topological Insulators

Published:2013-05-29 Issue:6 Volume:13 Page:2851-2856
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Jiang Ying¹,Wang Yong¹,Sagendorf Jared²,West Damien²,Kou Xufeng³,Wei Xiao¹,He Liang³,Wang Kang L.³,Zhang Shengbai²,Zhang Ze¹

Affiliation:

1. Center of Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

2. Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180, United States

3. Department of Electrical Engineering, University of California, Los Angeles, California 90095, United States

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl401186d

Reference33 articles.

1. Structural defects in Cu-doped Bi2Te3single crystals

2. A Mesoporous Anisotropic n-Type Bi2Te3Monolith with Low Thermal Conductivity as an Efficient Thermoelectric Material

3. Gate-Controlled Surface Conduction in Na-Doped Bi2Te3 Topological Insulator Nanoplates

4. Manipulating surface states in topological insulator nanoribbons

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