Young’s Modulus, Residual Stress, and Crystal Orientation of Doubly Clamped Silicon Nanowire Beams-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Young’s Modulus, Residual Stress, and Crystal Orientation of Doubly Clamped Silicon Nanowire Beams

Published:2015-04-14 Issue:5 Volume:15 Page:2945-2950
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Calahorra Y.¹,Shtempluck O.¹,Kotchetkov V.¹,Yaish Y. E.¹

Affiliation:

1. Department of Electrical Engineering, Technion, Haifa 32000, Israel

Funder

Ministry of Industry, Trade and Labor

Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl5047939

Reference49 articles.

1. High Performance Silicon Nanowire Field Effect Transistors

2. Synthesis and Fabrication of High-Performance n-Type Silicon Nanowire Transistors

3. Electrical Characteristics of the Backgated Bottom-Up Silicon Nanowire FETs

4. Very High Frequency Silicon Nanowire Electromechanical Resonators

5. Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Cited by 61 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of the Bending Behavior in Silicon Nanowires: A Nanomechanical Modeling Perspective;International Journal of Applied Mechanics;2024-07-12

2. Silicon nanowire piezoresistor and its applications: a review;Nanotechnology;2024-06-20

3. High-throughput membrane deflection characterization of shape memory alloy thin films;Materials Science and Engineering: A;2024-02

4. In Situ Bending Measurement of High-Temperature Oxidized Sic Nanowires Using a Double-Cantilever-Beam Contour-Modeling Technique within Tem;2024

5. Dimension-dependent mechanical features of Au-nanocrystalline nanofilms;Nano Research;2023-09-08

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3