A Computational Investigation of C60 Depth Profiling of Ag: Molecular Dynamics of Multiple Impact Events-Reference-Cited by-同舟云学术

A Computational Investigation of C60 Depth Profiling of Ag: Molecular Dynamics of Multiple Impact Events

Published:2009-01-30 Issue:8 Volume:113 Page:3270-3276
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Russo Michael F.¹,Postawa Zbigniew¹,Garrison Barbara J.¹

Affiliation:

1. Department of Chemistry, 104 Chemistry Building, Penn State University, University Park, Pennsylvania 16802, and Smoluchowski Institute of Physics, Jagiellonian University, ul. Reymonta 4, 30-059, Kraków, Poland

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp808706y

Reference35 articles.

1. View from the edge

2. The Magic of Cluster SIMS

3. Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

4. Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects

5. Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt–Co alloy multilayer by SIMS using a Buckminsterfullerene (C60) source

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