Electron Field Emission Properties of Nanomaterials on Rough Silicon Rods-Reference-Cited by-同舟云学术

Electron Field Emission Properties of Nanomaterials on Rough Silicon Rods

Published:2009-11-03 Issue:1 Volume:114 Page:130-133
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Wu Hung-Chi¹,Tsai Tsung-Yen¹,Chu Fu-Hsuan¹,Tai Nyan-Hwa¹,Lin Heh-Nan¹,Chiu Hsin-Tien¹,Lee Chi-Young¹

Affiliation:

1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, Republic of China, Department of Applied Chemistry, National Chiao Tung University, Hsinchu, Taiwan 30010, Republic of China, and Center for Nanotechnology, Materials Science, and Microsystems, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp908566q

Reference26 articles.

1. Controlled growth and electrical properties of heterojunctions of carbon nanotubes and silicon nanowires

2. Room-Temperature Ultraviolet Nanowire Nanolasers

3. Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species

4. A Carbon Nanotube Field-Emission Electron Source

5. Characterization and Field-Emission Properties of Needle-like Zinc Oxide Nanowires Grown Vertically on Conductive Zinc Oxide Films

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