Quantitative Measurement of the Electron and Hole Mobility−Lifetime Products in Semiconductor Nanowires-Reference-Cited by-同舟云学术

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Quantitative Measurement of the Electron and Hole Mobility−Lifetime Products in Semiconductor Nanowires

Published:2006-04-01 Issue:5 Volume:6 Page:948-952
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Gu Yi¹,Romankiewicz John P.¹,David John K.¹,Lensch Jessica L.¹,Lauhon Lincoln J.¹

Affiliation:

1. Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl052576y

Reference30 articles.

1. One-Dimensional Nanostructures: Synthesis, Characterization, and Applications

2. The Incredible Shrinking Circuit

3. Highly Polarized Photoluminescence and Photodetection from Single Indium Phosphide Nanowires

4. Room-Temperature Ultraviolet Nanowire Nanolasers

5. Nanolasers: lasing from nanoscale quantum wires

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