Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging-Reference-Cited by-同舟云学术

Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging

Published:2022-07-21 Issue:30 Volume:94 Page:10754-10763
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

De Castro Olivier¹,Audinot Jean-Nicolas¹^ORCID,Hoang Hung Quang¹^ORCID,Coulbary Chérif¹,Bouton Olivier²,Barrahma Rachid²,Ost Alexander¹³^ORCID,Stoffels Charlotte¹³^ORCID,Jiao Chengge⁴,Dutka Mikhail⁴,Geryk Michal⁵,Wirtz Tom¹

Affiliation:

1. Advanced Instrumentation for Nano-Analytics, MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

2. Prototyping, MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

3. Faculty of Science, Technology and Medicine, University of Luxembourg, 2 Avenue de l’Université, L-4365 Esch-sur-Alzette, Luxembourg

4. Thermo Fisher Scientific; Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands

5. Thermo Fisher Scientific; Vlastimila Pecha 12, 627 00 Brno, Czech Republic

Funder

Fonds National de la Recherche Luxembourg

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.2c01410

Reference35 articles.

1. The application of focused ion beam microscopy in the material sciences

2. FIB-SEM as a Volume Electron Microscopy Approach to Study Cellular Architectures in SARS-CoV-2 and Other Viral Infections: A Practical Primer for a Virologist

3. Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM

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