Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System-Reference-Cited by-同舟云学术

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Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Castro Olivier De¹,Hoang Hung Quang¹,Bouton Olivier²,Barrahma Rachid²,Coulbary Chérif¹,Wirtz Tom¹

Affiliation:

1. Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology , Belvaux , Luxembourg

2. Conception & Prototyping of MRT Technology Assets, Materials Research and Technology Department, Luxembourg Institute of Science and Technology , Belvaux , Luxembourg

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.297/58672786/ozae044.297.pdf

Reference4 articles.

1. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope

2. npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles

3. Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging

4. Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging

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