Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference29 articles.
1. High resolution focused ion beams;Orloff,2003
2. Introduction to focused ion beams: instrumentation, theory, techniques and practice,2005
3. Focused ion beam systems: basics and applications,2007
4. Focused ion beam techniques for nanomaterials characterization;Langford;Microsc. Res. Tech.,2006
5. Focused ion beam microscopy and micromachining, MRS Bulletin, Volkert CA, Minor AM, (eds). vol. 32, 2007, pp. 389–432.
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