Subject
Medical Laboratory Technology,Instrumentation,Histology,Anatomy
Reference83 articles.
1. , . 2000. Perpendicular cutting for cross-sectional SEM preparation of layered materials by broad ion beam. In: Proceedings of Eurem 12, Brno, Czech Republic. p. 563–564.
2. Electromigration damage in mechanically deformed Al conductor lines: dislocations as fast diffusion paths
3. , , , . 2004. The use of low energy milling to reduce surface damage on silicon resulting from focused ion beam milling. In: Proceedings of 13th European Microscopy Congress. p. 779–780.
4. Fibxtem— Focussed Ion Beam Milling for TEM Sample Preparation
5. Focused ion beam induced surface amorphization and sputter processes
Cited by
106 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献