Noninvasive Analysis of Thin Turbid Layers Using Microscale Spatially Offset Raman Spectroscopy-Reference-Cited by-同舟云学术

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Noninvasive Analysis of Thin Turbid Layers Using Microscale Spatially Offset Raman Spectroscopy

Published:2015-05-22 Issue:11 Volume:87 Page:5810-5815
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Conti Claudia¹,Realini Marco¹,Colombo Chiara¹,Sowoidnich Kay²,Afseth Nils Kristian³,Bertasa Moira¹,Botteon Alessandra¹,Matousek Pavel²

Affiliation:

1. Institute for the Conservation and Valorization of Cultural Heritage (ICVBC), National Research Council, Via Cozzi 53, 20125, Milano, Italy

2. Central Laser Facility, Research Complex at Harwell, STFC Rutherford Appleton Laboratory, Harwell Oxford, OX11 0QX, United Kingdom

3. Nofima-Norwegian Institute of Food, Fisheries and Aquaculture Research, PB 210, N-1431 Ås, Norway

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.5b01080

Reference20 articles.

1. Confocal Raman Microscopy

2. Subsurface Raman Analysis of Thin Painted Layers

3. Subsurface analysis of painted sculptures and plasters using micrometre‐scale spatially offset Raman spectroscopy (micro‐SORS)

4. Subsurface Probing in Diffusely Scattering Media Using Spatially Offset Raman Spectroscopy

5. Numerical Simulations of Subsurface Probing in Diffusely Scattering Media Using Spatially Offset Raman Spectroscopy

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