Subsurface Raman Analysis of Thin Painted Layers

Author:

Conti Claudia1,Colombo Chiara1,Realini Marco1,Zerbi Giuseppe2,Matousek Pavel3

Affiliation:

1. Consiglio Nazionale delle Ricerche, Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (ICVBC), Via Cozzi 53, 20125, Milan, Italy

2. Politecnico di Milano, Dip. Chimica, Materiali, Ingegneria Chimica “Giulio Natta,” Piazza Leonardo da Vinci 32, 20133 Milan, Italy

3. Central Laser Facility, Research Complex at Harwell, STFC Rutherford Appleton Laboratory, Harwell Oxford OX11 0QX, United Kingdom

Abstract

Here we present, for the first time, an extension of spatially offset Raman spectroscopy to thin (tens of micrometers thick), highly turbid stratified media such as those encountered in paintings. The method permits the non-destructive interrogation of painted layers in situations where conventional Raman microscopy is not applicable due to high turbidity of the top layer(s). The concept is demonstrated by recovering the pure Raman spectra of paint sub-layers that are completely obscured by paint over-layers. Potential application areas include the analysis of paintings in art preservation and restoration avoiding the cross-sectional analysis used currently with this type of samples. The technique also holds promise for the development as a non-destructive subsurface tool for in situ analysis using portable instruments.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

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