Comparative Study of the Usefulness of Low Energy Cs+, Xe+, and O2+ Ions for Depth Profiling Amino-Acid and Sugar Films
Author:
Affiliation:
1. Research Centre in Physics of Matter and Radiation (PMR), University of Namur (FUNDP), 61, rue de Bruxelles, B-5000 Namur, Belgium
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac101696c
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4. Investigation of molecular weight effects of polystyrene in ToF-SIMS using C60+ and Au+ primary ion beams
5. A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems
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4. In situ cationization of molecular ions sputtered from organic specimens under cluster bombardment;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05
5. Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding;Analytical Chemistry;2015-09-25
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