Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding-Reference-Cited by-同舟云学术

Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding

Published:2015-09-25 Issue:19 Volume:87 Page:10025-10032
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Philipp Patrick¹,Angerer Tina B.²,Sämfors Sanna³,Blenkinsopp Paul⁴,Fletcher John S.²³,Wirtz Tom¹

Affiliation:

1. Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), L-4422 Belvaux, Luxembourg

2. Department of Chemistry and Molecular Biology, University of Gothenburg, SE-412 96, Gothenburg, Sweden

3. Department of Chemistry and Chemical Engineering, Chalmers University of Technology, SE-412 90 Gothenburg, Sweden

4. Ionoptika Ltd., Chandlers Ford, Southampton, U.K.

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.5b02635

Reference39 articles.

1. Evaluation of a cesium positive ion source for secondary ion mass spectrometry

2. Optimization of secondary ion mass spectrometry for quantitative trace analysis

3. Caesium flooding on metal surfaces and sputtered negative ion yields

4. Negative Ion Emission from Surfaces Covered with Cesium and Bombarded by Noble Gas Ions

5. Development of a column delivering a collimated stream of Cs0 for SIMS purposes

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