Sensing Sub-10 nm Wide Perturbations in Background Nanopatterns Using Optical Pseudoelectrodynamics Microscopy (OPEM)-Reference-Cited by-同舟云学术

Sensing Sub-10 nm Wide Perturbations in Background Nanopatterns Using Optical Pseudoelectrodynamics Microscopy (OPEM)

Published:2019-07-08 Issue:8 Volume:19 Page:5347-5355
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Zhu Jinlong¹^ORCID,Liu Yanan²,Yu Xin¹,Zhou Renjie¹³,Jin Jian-Ming²,Goddard Lynford L.¹

Affiliation:

1. Photonic Systems Laboratory, Department of Electrical and Computer Engineering, University of Illinois at Urbana−Champaign, Urbana, Illinois 61801, United States

2. Center for Computational Electromagnetics, Department of Electrical and Computer Engineering, University of Illinois at Urbana−Champaign, Urbana, Illinois 61801-2991, United States

3. Department of Biomedical Engineering, The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong, China

Funder

Zhejiang University

Cisco Systems

University of Illinois at Urbana-Champaign

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b01806

Reference40 articles.