Thickness-Dependent Dielectric Constant of Few-Layer In2Se3 Nanoflakes
Author:
Affiliation:
1. College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China
2. Physical Sciences and Engineering Division, King Abdullah University of Science and Technology, Thuwal 23955-6900, Saudi Arabia
Funder
Welch Foundation
Publisher
American Chemical Society (ACS)
Subject
Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.5b03575
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