Scanning Electron Thermal Absorbance Microscopy for Light Element Detection and Atomic Number Analysis-Reference-Cited by-同舟云学术

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Scanning Electron Thermal Absorbance Microscopy for Light Element Detection and Atomic Number Analysis

Published:2022-03-10 Issue:7 Volume:22 Page:2667-2673
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Lin Ching-Che¹,Wang Shih-Ming¹²,Chen Bo-Yi¹,Chi Cheng-Hung¹,Chang I-Ling²,Chang Chih-Wei¹³^ORCID

Affiliation:

1. Center for Condensed Matter Sciences, National Taiwan University, Taipei 10617, Taiwan

2. Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan

3. Center of Atomic Initiative for New Materials (AI-MAT), National Taiwan University, Taipei, 10617, Taiwan

Funder

Ministry of Education

Ministry of Science and Technology, Taiwan

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.1c04502

Reference34 articles.

1. Nanoscale temperature mapping in operating microelectronic devices

2. Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy

3. Thermometry with Subnanometer Resolution in the Electron Microscope Using the Principle of Detailed Balancing

4. Thermometry of Silicon Nanoparticles

5. Measuring nanoscale thermal gradients in suspended MoS2 with STEM-EELS

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1. Standardization and quantification of backscattered electron imaging in scanning electron microscopy;Ultramicroscopy;2024-08

2. A three-probe method for accurate nanoscale thermal transport measurements;Applied Physics Letters;2024-04-29

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