Standardization and quantification of backscattered electron imaging in scanning electron microscopy-Reference-Cited by-同舟云学术

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Standardization and quantification of backscattered electron imaging in scanning electron microscopy

Published:2024-08 Issue: Volume:262 Page:113982
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wang Shih-Ming,Chiu Yu-Cheng,Wu Yu-Hsin,Chen Bo-Yi,Chang I-Ling,Chang Chih-Wei^ORCID

Publisher

Elsevier BV

Reference23 articles.

1. Principles of Electron Backscattering on Solids;Niedrig;Mikroskopie,1978

2. Film-Thickness Determination in Electron-Microscopy - Electron Backscattering Method;Niedrig;Opt. Acta,1977

3. Electron Probe Microanalysis: A Review of the Past, Present, and Future;Rinaldi;Microsc. Microanal.,2015

4. Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Llovet;Prog. Mater. Sci.,2021

5. Electron imaging with an EBSD detector;Wright;Ultramicroscopy,2015

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