Electron imaging with an EBSD detector-Reference-Cited by-同舟云学术

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Electron imaging with an EBSD detector

Published:2015-01 Issue: Volume:148 Page:132-145
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wright Stuart I.,Nowell Matthew M.,de Kloe René,Camus Patrick,Rampton Travis

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Orientation imaging: the emergence of a new microscopy;Adams;Metall. Trans. A,1993

2. A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods;Day;J. Microsc.,1999

3. Orientation contrast imaging of microstructures rocks using forescatter detectors in the scanning electron-microscope;Prior;Mineral. Mag.,1996

4. Forward Scatter Detector, EDAX Product Bulletin, 2011.

5. EBSD image quality mapping;Wright;Microsc. Microanal.,2006

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