Far-Infrared Near-Field Optical Imaging and Kelvin Probe Force Microscopy of Laser-Crystallized and -Amorphized Phase Change Material Ge3Sb2Te6-Reference-Cited by-同舟云学术

Far-Infrared Near-Field Optical Imaging and Kelvin Probe Force Microscopy of Laser-Crystallized and -Amorphized Phase Change Material Ge3Sb2Te6

Published:2021-10-19 Issue:21 Volume:21 Page:9012-9020
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Barnett Julian¹^ORCID,Wehmeier Lukas²³^ORCID,Heßler Andreas¹,Lewin Martin¹^ORCID,Pries Julian¹,Wuttig Matthias¹^ORCID,Klopf J. Michael⁴^ORCID,Kehr Susanne C.²,Eng Lukas M.²³,Taubner Thomas¹

Affiliation:

1. I. Institute of Physics (IA), RWTH Aachen, 52074 Aachen, Germany

2. Institute of Applied Physics, Technische Universität Dresden, 01062 Dresden, Germany

3. ct.qmat, Dresden-Würzburg Cluster of Excellence-EXC 2147, Technische Universität Dresden, 01062 Dresden, Germany

4. Institute of Radiation Physics, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany

Funder

Bundesministerium f??r Bildung und Forschung

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.1c02353

Reference85 articles.

1. Phase-change materials for non-volatile photonic applications

2. Tunable nanophotonics enabled by chalcogenide phase-change materials

3. Photonic Ge-Sb-Te phase change metamaterials and their applications

4. Optical Metasurfaces: Evolving from Passive to Adaptive

5. Spatiotemporal light control with active metasurfaces

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