Atomic Resolution Imaging of Highly Air-Sensitive Monolayer and Twisted-Bilayer WTe<sub>2</sub>-Reference-Cited by-同舟云学术

Atomic Resolution Imaging of Highly Air-Sensitive Monolayer and Twisted-Bilayer WTe₂

Published:2023-07-21 Issue:15 Volume:23 Page:6868-6874
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Yuan Fang¹^ORCID,Jia Yanyu²^ORCID,Cheng Guangming³^ORCID,Singha Ratnadwip¹^ORCID,Lei Shiming¹,Yao Nan³^ORCID,Wu Sanfeng²^ORCID,Schoop Leslie M.¹^ORCID

Affiliation:

1. Department of Chemistry, Princeton University, Princeton, New Jersey 08544, United States

2. Department of Physics, Princeton University, Princeton, New Jersey 08544, United States

3. Princeton Materials Institute, Princeton University, Princeton, New Jersey 08544, United States

Funder

Princeton Center for Complex Materials

Princeton University

Gordon and Betty Moore Foundation

David and Lucile Packard Foundation

Office of Naval Research

Division of Materials Research

Princeton Catalysis Initiative

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.3c01175

Reference31 articles.

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