Anisotropic Resonant X-ray Diffraction of a Conjugated Polymer at the Sulfur K-Edge-Reference-Cited by-同舟云学术

Anisotropic Resonant X-ray Diffraction of a Conjugated Polymer at the Sulfur K-Edge

Published:2021-04-12 Issue:15 Volume:12 Page:3762-3766
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Freychet Guillaume¹,Gann Eliot²^ORCID,Zhernenkov Mikhail¹^ORCID,McNeill Christopher R.³^ORCID

Affiliation:

1. NSLS-II, Brookhaven National Laboratory, Upton, New York 11973, United States

2. Materials Measurement Science Division, Materials Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

3. Department of Materials Science and Engineering, Monash University, Wellington Road, Clayton, Victoria 3800, Australia

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.1c00532

Reference21 articles.

1. Semiconducting polymers: the Third Generation

2. Two-dimensional charge transport in self-organized, high-mobility conjugated polymers

3. Remarkable Order of a High-Performance Polymer

4. Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale

5. Resonant Tender X-ray Diffraction for Disclosing the Molecular Packing of Paracrystalline Conjugated Polymer Films

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