Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale-Reference-Cited by-同舟云学术

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Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale

Published:2012-08-09 Issue:10 Volume:112 Page:5488-5519
ISSN:0009-2665
Container-title:Chemical Reviews
language:en
Short-container-title:Chem. Rev.

Author:

Rivnay Jonathan¹,Mannsfeld Stefan C. B.²,Miller Chad E.²,Salleo Alberto¹,Toney Michael F.²

Affiliation:

1. Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States

2. Stanford Synchrotron Radiation Lightsource (SSRL), SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States

Publisher

American Chemical Society (ACS)

Subject

General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cr3001109

Reference227 articles.

1. Materials and Applications for Large Area Electronics: Solution-Based Approaches

2. Organic Electronics

3. Printing Methods and Materials for Large-Area Electronic Devices

4. Role of Molecular Order and Solid-State Structure in Organic Field-Effect Transistors

5. Imaging the domain structure of organic semiconductor films

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