Flatfielding of hybrid pixel detectors in tender x-ray scattering
Author:
Affiliation:
1. National Synchrotron Light Source-II, Brookhaven National Laboratory 1 , Upton, New York 11973, USA
2. Univ. Grenoble Alpes, CEA, Leti 2 , F-38000 Grenoble, France
Abstract
Funder
Brookhaven National Laboratory
Publisher
AIP Publishing
Subject
Instrumentation
Link
https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/5.0139377/17339639/053101_1_5.0139377.pdf
Reference23 articles.
1. Defining the Nanostructured Morphology of Triblock Copolymers Using Resonant Soft X-ray Scattering
2. Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis
3. Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films
4. Resonant CarbonK-Edge Soft X-Ray Scattering from Lattice-Free Heliconical Molecular Ordering: Soft Dilative Elasticity of the Twist-Bend Liquid Crystal Phase
5. Reconstructing the three-dimensional latent image of extreme ultraviolet resists with resonant soft x-ray scattering
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