Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
Author:
Affiliation:
1. Department of Imaging Physics, Delft University of Technology, 2628 CN Delft, The Netherlands
2. Kavli Institute of Nanoscience, Delft University of Technology, 2628 CJ Delft, The Netherlands
Funder
H2020 European Research Council
Publisher
American Chemical Society (ACS)
Subject
General Materials Science,Physical and Theoretical Chemistry
Link
http://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.0c02345
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